| Название | Описание | Производитель | Корпус | Выводы | Темп. Диапазон | Файл PDF |
| AD664AD-UNI | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog Devices | DIP | 28 | 0°C | 70°C | AD664AD-UNI datasheet (551K) |
| AD664AJ | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog Devices | LCC | 44 | 0°C | 70°C | AD664AJ datasheet (551K) |
| AD664BD-BIP | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog Devices | DIP | 28 | 0°C | 70°C | AD664BD-BIP datasheet (551K) |
| AD664BD-UNI | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog Devices | DIP | 28 | 0°C | 70°C | AD664BD-UNI datasheet (551K) |
| AD664BE | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog Devices | LCC | 44 | 0°C | 70°C | AD664BE datasheet (551K) |
| AD664BJ | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog Devices | LCC | 44 | 0°C | 70°C | AD664BJ datasheet (551K) |
| AD664JN-BIP | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog Devices | DIP | 28 | -55°C | 125°C | AD664JN-BIP datasheet (551K) |
| AD664JN-BIP | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog Devices | DIP | 28 | -55°C | 125°C | AD664JN-BIP datasheet (551K) |
| AD664JP | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog Devices | PLCC | 44 | 0°C | 70°C | AD664JP datasheet (551K) |
| AD664KN-BIP | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog Devices | DIP | 28 | 0°C | 70°C | AD664KN-BIP datasheet (551K) |
