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| SN74ABT8952DW | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS | Texas Instruments | DW | 28 | -40°C | 85°C | SN74ABT8952DW datasheet (365K) |
| SN74ABT8952DWR | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS | Texas Instruments | DW | 28 | -40°C | 85°C | SN74ABT8952DWR datasheet (365K) |
| SN74ABT8996DWR | 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1194.1 (JTAG) TAP TRANSCEIVERS | Texas Instruments | DW | 24 | -40°C | 85°C | SN74ABT8996DWR datasheet (564K) |
| SN74ABT8996PWLE | 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1194.1 (JTAG) TAP TRANSCEIVERS | Texas Instruments | PW | 24 | -40°C | 85°C | SN74ABT8996PWLE datasheet (564K) |
| SN74ABT8996PWR | 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1194.1 (JTAG) TAP TRANSCEIVERS | Texas Instruments | PW | 24 | -40°C | 85°C | SN74ABT8996PWR datasheet (564K) |
| SN74ABTE16245DGGR | 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas Instruments | DGG | 48 | -40°C | 85°C | SN74ABTE16245DGGR datasheet (128K) |
| SN74ABTE16245DL | 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas Instruments | DL | 48 | -40°C | 85°C | SN74ABTE16245DL datasheet (128K) |
| SN74ABTE16245DLR | 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS | Texas Instruments | DL | 48 | -40°C | 85°C | SN74ABTE16245DLR datasheet (128K) |
| SN74ABTE16246DGGR | 11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS | Texas Instruments | DGG | 48 | -40°C | 85°C | SN74ABTE16246DGGR datasheet (161K) |
| SN74ABTE16246DL | 11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS | Texas Instruments | DL | 48 | -40°C | 85°C | SN74ABTE16246DL datasheet (161K) |